Items where Research Institute, Centre or Group is "Materials and Engineering Research Institute > Thin Films Research Centre > Electronic Materials and Sensors Research Group"
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Number of items at this level: 6.
EVANS-FREEMAN, J. H., EMIROGLU, D., GAD, M. A., MITROMARA, N. and VERNON-PARRY, K. D. (2006). Deep electronic states in ion-implanted Si. Journal of materials science.
EVANS-FREEMAN, J. H. and VERNON-PARRY, K. (2005). Optical and electrical activity of defects in rare earth implanted Si. Optical materials.
HASHIM, A. A., BARRATT, D. S., HASSAN, A. K., EVANS-FREEMAN, J. H. and NABOK, A. (2006). Resistivity network and structural model of the oxide cathode for CRT application. Journal of display technology, 2 (2), 186-93.
PEREIRA, Mauro (2011). Microscopic approach for intersubband-based thermophotovoltaic structures in the terahertz and mid-infrared. Journal of the Optical Society of America B, 28 (8), p. 2014.
PEREIRA, Mauro and TOMIĆ, Stanko (2011). Intersubband gain without global inversion through dilute nitride band engineering. Applied Physics Letters, 98 (6), 061101.
VERNON-PARRY, K. D., DAVIES, G. and GALLOWAY, S. (2004). Electronic and structural properties of grain boundaries in electron-irradiated edge-defined film-fed growth silicon. Semiconductor science and technology.