Electroplating of semiconductor Materials for Applications in Large Area Electronics: A Review

OJO, Ayotunde Adigun and DHARMADASA, I (2018). Electroplating of semiconductor Materials for Applications in Large Area Electronics: A Review. Coatings, 8 (8), p. 262.


Download (2MB) | Preview
Dharmadasa-ElectroplatingOfSemiconductorMaterialsForApplications(VoR).pdf - Published Version
Creative Commons Attribution.

Download (2MB) | Preview
Official URL: http://www.mdpi.com/2079-6412/8/8
Link to published version:: https://doi.org/10.3390/coatings8080262


The attributes of electroplating as a low-cost, simple, scalable, and manufacturable semiconductor deposition technique for the fabrication of large-area and nanotechnology-based device applications are discussed. These strengths of electrodeposition are buttressed experimentally using techniques such as X-ray diffraction, ultraviolet-visible spectroscopy, scanning electron microscopy, atomic force microscopy, energy-dispersive X-ray spectroscopy, and photoelectrochemical cell studies. Based on the results of structural, morphological, compositional, optical, and electronic properties evaluated, it is evident that electroplating possesses the capabilities of producing high-quality semiconductors usable for producing excellent devices. In this paper we will describe the progress of electroplating techniques mainly for the deposition of semiconductor thin film materials and their treatment processes, and fabrication of solar cells.

Item Type: Article
Research Institute, Centre or Group - Does NOT include content added after October 2018: Materials and Engineering Research Institute > Advanced Coatings and Composites Research Centre > Electronic Materials and Sensors Research Group
Identification Number: https://doi.org/10.3390/coatings8080262
Page Range: p. 262
Depositing User: Jill Hazard
Date Deposited: 31 Jul 2018 13:44
Last Modified: 18 Mar 2021 07:23
URI: https://shura.shu.ac.uk/id/eprint/22159

Actions (login required)

View Item View Item


Downloads per month over past year

View more statistics