Van der Pauw resistivity measurements on thermally evaporated copper phthalocyanine thin films

HASSAN, A. K., GOULD, R. D. and RAY, A. K. (1996). Van der Pauw resistivity measurements on thermally evaporated copper phthalocyanine thin films. physica status solidi a, 158 (2), K23-K25.

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Official URL: https://onlinelibrary.wiley.com/doi/abs/10.1002/ps...
Link to published version:: https://doi.org/10.1002/pssa.2211580234
Item Type: Article
Research Institute, Centre or Group - Does NOT include content added after October 2018: Materials and Engineering Research Institute > Advanced Coatings and Composites Research Centre > Electronic Materials and Sensors Research Group
Identification Number: https://doi.org/10.1002/pssa.2211580234
Page Range: K23-K25
Depositing User: Helen Garner
Date Deposited: 03 Jun 2010 10:58
Last Modified: 18 Mar 2021 13:16
URI: https://shura.shu.ac.uk/id/eprint/1988

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