Items where Author is "Echendu, O.K."

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ECHENDU, O.K., OKEOMA, K.B., ORIAKU, C.I. and DHARMADASA, I.M. (2016). Electrochemical deposition of CdTe semiconductor thin films for solar cell application using two-electrode and three-electrode configurations: a comparative study. Advances in Materials Science and Engineering. [Article]

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DHARMADASA, I., ALAM, A.E., OJO, A.A. and ECHENDU, O.K. (2019). Scientific complications and controversies noted in the field of CdS/CdTe thin film solar cells and the way forward for further development. Journal of Materials Science: Materials in Electronics, 30 (23), 20330-20344. [Article]

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ECHENDU, O.K., WERTA, S.Z., DEJENE, F.B., OJO, A.A. and DHARMADASA, I. (2019). Ga doping of nanocrystalline CdS thin films by electrodeposition method for solar cell application: The influence of dopant precursor concentration. Journal of Materials Science: Materials in Electronics, 30 (5), 4977-4989. [Article]

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ECHENDU, O.K., DEJENE, F.B. and DHARMADASA, I (2018). An investigation of the influence of different transparent conducting oxide substrates/front contacts on the performance of CdS/CdTe thin-film solar cells. Journal of Materials Science: Materials in Electronics, 28 (24), 18865-18872. [Article]

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ECHENDU, O.K. and DHARMADASA, I (2015). The effect on CdS/CdTe solar cell conversion efficiency of the presence of fluorine in the usual CdCl2 treatment of CdTe. Materials chemistry and physics, 157, 39-44. [Article]

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ECHENDU, O.K., FAUZI, F., WEERASINGHE, A.R. and DHARMADASA, I. (2014). High short-circuit current density CdTe solar cells using all-electrodeposited semiconductors. Thin Solid Films, 556, 529-534. [Article]

ECHENDU, O.K., FAUZI, F., WEERASINGHE, A.R. and DHARMADASA, I. (2014). High short-circuit current density CdTe solar cells using all-electrodeposited semiconductors. Thin Solid Films, 556, 529-534. [Article]

ECHENDU, O.K., WEERASINGHE, A.R., DISO, D.G., FAUZI, F. and DHARMADASA, I (2013). Characterization of n-Type and p-Type ZnS thin layers grown by an electrochemical method. Journal of Electronic Materials, 42 (4), 692-700. [Article]

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