Items where Author is "Echendu, O.K."
Number of items: 8.
DHARMADASA, I., ALAM, A.E., OJO, A.A. and ECHENDU, O.K.
(2019).
Scientific complications and controversies noted in the field of CdS/CdTe thin film solar cells and the way forward for further development.
Journal of Materials Science: Materials in Electronics, 30 (23), 20330-20344.
[Article]
ECHENDU, O.K., WERTA, S.Z., DEJENE, F.B., OJO, A.A. and DHARMADASA, I.
(2019).
Ga doping of nanocrystalline CdS thin films by electrodeposition method for solar cell application: The influence of dopant precursor concentration.
Journal of Materials Science: Materials in Electronics, 30 (5), 4977-4989.
[Article]
ECHENDU, O.K., DEJENE, F.B. and DHARMADASA, I
(2018).
An investigation of the influence of different transparent conducting oxide substrates/front contacts on the performance of CdS/CdTe thin-film solar cells.
Journal of Materials Science: Materials in Electronics, 28 (24), 18865-18872.
[Article]
ECHENDU, O.K., OKEOMA, K.B., ORIAKU, C.I. and DHARMADASA, I.M.
(2016).
Electrochemical deposition of CdTe semiconductor thin films for solar cell application using two-electrode and three-electrode configurations: a comparative study.
Advances in Materials Science and Engineering.
[Article]
ECHENDU, O.K. and DHARMADASA, I
(2015).
The effect on CdS/CdTe solar cell conversion efficiency of the presence of fluorine in the usual CdCl2 treatment of CdTe.
Materials chemistry and physics, 157, 39-44.
[Article]
ECHENDU, O.K., FAUZI, F., WEERASINGHE, A.R. and DHARMADASA, I.
(2014).
High short-circuit current density CdTe solar cells using all-electrodeposited semiconductors.
Thin Solid Films, 556, 529-534.
[Article]
ECHENDU, O.K., FAUZI, F., WEERASINGHE, A.R. and DHARMADASA, I.
(2014).
High short-circuit current density CdTe solar cells using all-electrodeposited semiconductors.
Thin Solid Films, 556, 529-534.
[Article]
ECHENDU, O.K., WEERASINGHE, A.R., DISO, D.G., FAUZI, F. and DHARMADASA, I
(2013).
Characterization of n-Type and p-Type ZnS thin layers grown by an electrochemical method.
Journal of Electronic Materials, 42 (4), 692-700.
[Article]