Items where Author is "Fielden, I."

FIELDEN, I., BULTREYS, D. and VYSTAVEL, T. (2007). In-situ focussed ion beam (FIB) microscopy at high temperature. In: Institute of Physics conference series. Electron Microscopy and Analysis Group (EMAG) 2007, Glasgow, Scotland, 03-07 September 2007. [Conference or Workshop Item]

FIELDEN, I. (2004). Results from in-situ, real-time SEM observations on grain growth in polycrystalline metal. Materials science forum, 467-47, 875-880. [Article]

FIELDEN, I. and RODENBURG, J. M. (2004). A technique for real-time, in situ SEM observation of grain growth at elevated temperatures. Materials science forum, 467-47, 1385-1388. [Article]