In-situ focussed ion beam (FIB) microscopy at high temperature

FIELDEN, I., BULTREYS, D. and VYSTAVEL, T. (2007). In-situ focussed ion beam (FIB) microscopy at high temperature. In: Institute of Physics conference series. Electron Microscopy and Analysis Group (EMAG) 2007, Glasgow, Scotland, 03-07 September 2007.

Full text not available from this repository.

Item Type:	Conference or Workshop Item (Paper)
Research Institute, Centre or Group - Does NOT include content added after October 2018:	Materials and Engineering Research Institute > Advanced Coatings and Composites Research Centre > Nanotechnology Centre for PVD Research
Depositing User:	Ann Betterton
Date Deposited:	28 Jul 2008
Last Modified:	19 Mar 2021 01:15
URI:	https://shura.shu.ac.uk/id/eprint/587

Actions (login required)

View Item

Downloads

Publication Metrics