LWELE, Emmanuel and SHENFIELD, Alex (2024). AI-Based Surrogate Models of Digital Twins for Industrial Processes. In: 2024 IEEE Industrial Electronics and Applications Conference (IEACon). IEEE, 89-94. [Book Section]
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AI_based_surrogate_models_of_digital_twins_for_Industrial_Processes__IEACon_2024_Conference_Paper.pdf - Accepted Version
Available under License Creative Commons Attribution.
AI_based_surrogate_models_of_digital_twins_for_Industrial_Processes__IEACon_2024_Conference_Paper.pdf - Accepted Version
Available under License Creative Commons Attribution.
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Abstract
Digital twins represent virtual replicas of physical systems, integrating real-time data and advanced analytics to monitor, simulate, and optimize industrial processes. This research delves into the application of AI-based surrogate models to improve the efficiency and accuracy of digital twins for industrial processes. The study employs machine learning techniques to develop computationally efficient models that maintain high accuracy. The integration of advanced sampling techniques and challenges related to data quality and interpretability are highlighted, proposing solutions to improve model robustness and reliability.
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