Backscattered SEM imaging of high-temperature samples for grain growth studies in metals

A novel technique is presented for SEM backscattered electron imaging of hot specimens, in-situ, in real time. The technique has been applied to recrystallisation, grain growth and phase transformation studies in metals, principally steel. Temperatures attained were in the order of 850degreesC and were limited by the capability of the specimen heater, not the detector. Representative results are presented as stills and video.