A time resolved high energy X-ray diffraction study of cooling liquid SiO2

SKINNER, L. B., BENMORE, C. J., WEBER, J. K. R., WILDING, Martin, TUMBER, S. K. and PARISE, J. B. (2013). A time resolved high energy X-ray diffraction study of cooling liquid SiO2. Physical Chemistry Chemical Physics, 15 (22), 8566-8572.

Full text not available from this repository.

Abstract

The evolution of the X-ray structure factor and corresponding pair distribution function of SiO2 has been measured upon cooling from the melt using high energy X-ray diffraction combined with aerodynamic levitation. Small changes in the position of the average Si–O bond distance and peak width are found to occur at ∼1500(100) K in the region of the calorimetric glass transition temperature, Tg and the observed density minima. At higher temperatures deviations from linear behavior are seen in the first sharp diffraction peak width, height and area at around 1750(50) K, which coincides with the reported density maximum around 1.2Tg.

Item Type:	Article
Research Institute, Centre or Group - Does NOT include content added after October 2018:	Materials and Engineering Research Institute > Engineering Research
Departments - Does NOT include content added after October 2018:	Faculty of Science, Technology and Arts > Department of Engineering and Mathematics
Identification Number:	https://doi.org/10.1039/C3CP44347G
Page Range:	8566-8572
Depositing User:	Martin Wilding
Date Deposited:	27 Jun 2018 08:56
Last Modified:	18 Mar 2021 11:46
URI:	https://shura.shu.ac.uk/id/eprint/21474

Actions (login required)

View Item

Downloads

Publication Metrics