Depth Resolved Measurement of the 3D Residual Stress State in Surface Engineered Aluminium by Synchrotron Diffraction

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ASQUITH, David, HUGHES, Darren, HATTINGH, Danie, JAMES, Neil, JOHN, Yates and ALEKSEY, Yerokhin (2013). Depth Resolved Measurement of the 3D Residual Stress State in Surface Engineered Aluminium by Synchrotron Diffraction. In: SHIH, Kaimin, (ed.) X-Ray Diffraction : Structure, Principles and Applications. Materials Science and Technologies . Nova Science. [Book Section]

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ISBN:
9781628085914

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ORCID:
https://orcid.org/0000-0002-0724-7415

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Item Type:
Book Section
Depositing User:
David Asquith
Date Deposited:
16 Feb 2016 10:13
Last Modified:
18 Mar 2021 15:52
Date of first compliant deposit:
25 April 2016
Date of first compliant Open Access:
25 April 2016
Version of first compliant deposit:
Version of Record
URI:
https://shura.shu.ac.uk/id/eprint/11293
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