Depth Resolved Measurement of the 3D Residual Stress State in Surface Engineered Aluminium by Synchrotron Diffraction

Tools

ASQUITH, David, HUGHES, Darren, HATTINGH, Danie, JAMES, Neil, JOHN, Yates and ALEKSEY, Yerokhin (2013). Depth Resolved Measurement of the 3D Residual Stress State in Surface Engineered Aluminium by Synchrotron Diffraction. In: SHIH, Kaimin, (ed.) X-Ray Diffraction : Structure, Principles and Applications. Materials Science and Technologies . Nova Science. [Book Section]

Documents
11293:34949
[thumbnail of Asquith Depth resolved measurement 3D.pdf]
Preview
PDF
Asquith Depth resolved measurement 3D.pdf - Published Version
Available under License All rights reserved.

Download (1MB) | Preview
More Information
ISBN:
9781628085914

Identifiers

ORCID for David Asquith: ORCID iD orcid.org/0000-0002-0724-7415

Library

Item Type:
Book Section
Depositing User:
David Asquith
Date Deposited:
16 Feb 2016 10:13
Last Modified:
19 Dec 2024 00:23
Date of first compliant deposit:
25 April 2016
Date of first compliant Open Access:
25 April 2016
Version of first compliant deposit:
Version of Record
URI:
https://shura.shu.ac.uk/id/eprint/11293
Statistics

Downloads

Downloads per month over past year

View more statistics

Metrics

Altmetric Badge

Dimensions Badge

Share
Add to AnyAdd to TwitterAdd to FacebookAdd to LinkedinAdd to PinterestAdd to Email

Actions (login required)

View Item View Item

SHURA supports OAI 2.0 with a base URL of https://shura.shu.ac.uk/cgi/oai2