Backscattered SEM imaging of high-temperature samples for grain growth studies in metals

FIELDEN, Iain, CAWLEY, J. and RODENBURG, J. M. (2004). Backscattered SEM imaging of high-temperature samples for grain growth studies in metals. Electron microscopy and analysis (179), 181-184.

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    Abstract

    A novel technique is presented for SEM backscattered electron imaging of hot specimens, in-situ, in real time. The technique has been applied to recrystallisation, grain growth and phase transformation studies in metals, principally steel. Temperatures attained were in the order of 850degreesC and were limited by the capability of the specimen heater, not the detector. Representative results are presented as stills and video.

    Item Type: Article
    Additional Information: Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG 2003) SEP 03-05, 2003 Univ Oxford, Examinat Sch, Oxford, ENGLAND
    Research Institute, Centre or Group - Does NOT include content added after October 2018: Materials and Engineering Research Institute > Materials Analysis and Research Services
    Page Range: 181-184
    Depositing User: Ann Betterton
    Date Deposited: 12 Jul 2010 16:24
    Last Modified: 18 Mar 2021 09:45
    URI: http://shura.shu.ac.uk/id/eprint/2338

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