Depth Resolved Measurement of the 3D Residual Stress State in Surface Engineered Aluminium by Synchrotron Diffraction

ASQUITH, David, HUGHES, Darren, HATTINGH, Danie, JAMES, Neil, JOHN, Yates and ALEKSEY, Yerokhin (2013). Depth Resolved Measurement of the 3D Residual Stress State in Surface Engineered Aluminium by Synchrotron Diffraction. In: SHIH, Kaimin, (ed.) X-Ray Diffraction : Structure, Principles and Applications. Materials Science and Technologies . Nova Science. [Book Section]

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11293:34949

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ISBN:

9781628085914

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ORCID:

https://orcid.org/0000-0002-0724-7415

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Item Type:

Book Section

Depositing User:

David Asquith

Date Deposited:

16 Feb 2016 10:13

Last Modified:

18 Mar 2021 15:52

Date of first compliant deposit:

25 April 2016

Date of first compliant Open Access:

25 April 2016

Version of first compliant deposit:

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URI:

https://shura.shu.ac.uk/id/eprint/11293

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