Items where Author is "Vystavel, T."
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FIELDEN, I., BULTREYS, D. and VYSTAVEL, T.
(2007).
In-situ focussed ion beam (FIB) microscopy at high temperature.
In: Institute of Physics conference series. Electron Microscopy and Analysis Group (EMAG) 2007, Glasgow, Scotland, 03-07 September 2007.