Items where Author is "Fielden, I."
Jump to: None
Number of items: 3.
None
FIELDEN, I., BULTREYS, D. and VYSTAVEL, T.
(2007).
In-situ focussed ion beam (FIB) microscopy at high temperature.
In: Institute of Physics conference series. Electron Microscopy and Analysis Group (EMAG) 2007, Glasgow, Scotland, 03-07 September 2007.
FIELDEN, I.
(2004).
Results from in-situ, real-time SEM observations on grain growth in polycrystalline metal.
Materials science forum, 467-47, 875-880.
FIELDEN, I. and RODENBURG, J. M.
(2004).
A technique for real-time, in situ SEM observation of grain growth at elevated temperatures.
Materials science forum, 467-47, 1385-1388.