HOLLOWAY, A., NABOK, A. V., THOMPSON, M., RAY, A. K., CROWTHER, D. and SIDDIQI, J. (2003). New method of vapour discrimination using the thickness shear mode (TSM) resonator. Sensors, 3 (6), 187-191.Full text not available from this repository.
The impedance analysis technique complemented with curve fitting software was used to monitor changes in film properties of Thickness Shear Mode (TSM) resonator on vapour exposure. The approach demonstrates how sensor selectivity can be achieved through unique changes in film viscosity caused by organic vapour adsorption.
|Research Institute, Centre or Group:||Materials and Engineering Research Institute > Centre for Robotics and Automation > Mobile Machine and Vision Laboratory|
|Depositing User:||Ann Betterton|
|Date Deposited:||10 Mar 2008|
|Last Modified:||22 Oct 2010 16:49|
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