New method of vapour discrimination using the thickness shear mode (TSM) resonator

HOLLOWAY, A., NABOK, A. V., THOMPSON, M., RAY, A. K., CROWTHER, D. and SIDDIQI, J. (2003). New method of vapour discrimination using the thickness shear mode (TSM) resonator. Sensors, 3 (6), 187-191.

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Official URL: http://www.mdpi.org/sensors/papers/s30600187.pdf
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    Abstract

    The impedance analysis technique complemented with curve fitting software was used to monitor changes in film properties of Thickness Shear Mode (TSM) resonator on vapour exposure. The approach demonstrates how sensor selectivity can be achieved through unique changes in film viscosity caused by organic vapour adsorption.

    Item Type: Article
    Research Institute, Centre or Group - Does NOT include content added after October 2018: Materials and Engineering Research Institute > Centre for Automation and Robotics Research > Mobile Machine and Vision Laboratory
    Page Range: 187-191
    Depositing User: Ann Betterton
    Date Deposited: 10 Mar 2008
    Last Modified: 13 Jun 2017 12:44
    URI: http://shura.shu.ac.uk/id/eprint/388

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