New method of vapour discrimination using the thickness shear mode (TSM) resonator

HOLLOWAY, A., NABOK, A. V., THOMPSON, M., RAY, A. K., CROWTHER, D. and SIDDIQI, J. (2003). New method of vapour discrimination using the thickness shear mode (TSM) resonator. Sensors, 3 (6), 187-191.

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Official URL: http://www.mdpi.org/sensors/papers/s30600187.pdf

Abstract

The impedance analysis technique complemented with curve fitting software was used to monitor changes in film properties of Thickness Shear Mode (TSM) resonator on vapour exposure. The approach demonstrates how sensor selectivity can be achieved through unique changes in film viscosity caused by organic vapour adsorption.

Item Type: Article
Research Institute, Centre or Group: Materials and Engineering Research Institute > Centre for Robotics and Automation > Mobile Machine and Vision Laboratory
Depositing User: Ann Betterton
Date Deposited: 10 Mar 2008
Last Modified: 22 Oct 2010 16:49
URI: http://shura.shu.ac.uk/id/eprint/388

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