FIELDEN, Iain, CAWLEY, J. and RODENBURG, J. M. (2004). Backscattered SEM imaging of high-temperature samples for grain growth studies in metals. Electron microscopy and analysis (179), 181-184.Full text not available from this repository.
A novel technique is presented for SEM backscattered electron imaging of hot specimens, in-situ, in real time. The technique has been applied to recrystallisation, grain growth and phase transformation studies in metals, principally steel. Temperatures attained were in the order of 850degreesC and were limited by the capability of the specimen heater, not the detector. Representative results are presented as stills and video.
|Additional Information:||Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG 2003) SEP 03-05, 2003 Univ Oxford, Examinat Sch, Oxford, ENGLAND|
|Research Institute, Centre or Group:||Materials and Engineering Research Institute > Materials Analysis and Research Services|
|Depositing User:||Ann Betterton|
|Date Deposited:||12 Jul 2010 17:24|
|Last Modified:||12 Jul 2010 17:24|
Actions (login required)
Downloads per month over past year