ASQUITH, David, HUGHES, Darren, HATTINGH, Danie, JAMES, Neil, JOHN, Yates and ALEKSEY, Yerokhin (2013). Depth Resolved Measurement of the 3D Residual Stress State in Surface Engineered Aluminium by Synchrotron Diffraction. In: SHIH, Kaimin, (ed.) X-Ray Diffraction : Structure, Principles and Applications. Materials Science and Technologies . Nova Science.
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Asquith Depth resolved measurement 3D.pdf - Published Version All rights reserved. Download (1MB) | Preview |
Item Type: | Book Section |
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Depositing User: | David Asquith |
Date Deposited: | 16 Feb 2016 10:13 |
Last Modified: | 18 Mar 2021 15:52 |
URI: | https://shura.shu.ac.uk/id/eprint/11293 |
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