Depth Resolved Measurement of the 3D Residual Stress State in Surface Engineered Aluminium by Synchrotron Diffraction

ASQUITH, David, HUGHES, Darren, HATTINGH, Danie, JAMES, Neil, JOHN, Yates and ALEKSEY, Yerokhin (2013). Depth Resolved Measurement of the 3D Residual Stress State in Surface Engineered Aluminium by Synchrotron Diffraction. In: SHIH, Kaimin, (ed.) X-Ray Diffraction : Structure, Principles and Applications. Materials Science and Technologies . Nova Science.

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Item Type: Book Section
Depositing User: David Asquith
Date Deposited: 16 Feb 2016 10:13
Last Modified: 19 Oct 2016 21:07
URI: http://shura.shu.ac.uk/id/eprint/11293

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