Items where Author is "Tsargorodskaya, A."

NABOK, A., TSARGORODSKAYA, A., MUSTAFA, M. K., SZÉKÁCS, I., STARODUB, N. F. and SZÉKÁCS, A. (2011). Detection of low molecular weight toxins using an optical phase method of ellipsometry. Sensors and Actuators B-Chemical, 154 (2), 232-237. [Article]

NABOK, A., PARKINSON, D., MUSTAFA, M. K. and TSARGORODSKAYA, A. (2010). Detection of amyloid precursor protein using ellipsometry immunosensor with a view to Alzheimer's disease diagnostics. Sensors and transducers, 120 (9), 53-61. [Article]

MUSTAFA, M. K., NABOK, A., PARKINSON, D., TOTHILL, I. E., SALAM, F. and TSARGORODSKAYA, A. (2010). Detection of β-amyloid peptide (1–16) and amyloid precursor protein (APP770) using spectroscopic ellipsometry and QCM techniques: A step forward towards Alzheimers disease diagnostics. Biosensors and Bioelectronics, 26 (4), 1332-1336. [Article]

NABOK, A. V., TSARGORODSKAYA, A., GAUTHIER, D., DAVIS, F., HIGSON, S. P. J., BERZINA, T., CRISTOFOLINI, L. and FONTANA, M. P. (2009). Hybridization of Genomic DNA Adsorbed Electrostatically onto Cationic Surfaces. The Journal of Physical Chemistry B, 113 (22), 7897-7902. [Article]

BASOVA, T., TSARGORODSKAYA, A., NABOK, A. V., HASSAN, A. K., GUREK, A. G., GUMUS, G. and AHSEN, V. (2009). Investigation of gas-sensing properties of copper phthalocyanine films. Materials Science and Engineering C, 29 (3), 814-818. [Article]

TSARGORODSKAYA, A., LISHCHUK, S. V. and NABOK, A. V. (2008). The model of alkylphenol micelles bound to respective antibodies on the solid surface. Colloids and Surfaces A Physicochemical and Engineering Aspects, 324 (1-3), 117-121. [Article]

NABOK, A. V., TSARGORODSKAYA, A., HASSAN, A. K. and DAVIS, F. (2008). Electrostatically self-assembled films containing II-VI semiconductor nanoparticles: Optical and electrical properties. Thin Solid Films, 516 (24), 8917-8925. [Article]

NABOK, A. V. and TSARGORODSKAYA, A. (2008). The method of total internal reflection ellipsometry for thin film characterisation and sensing. Thin Solid Films, 516 (24), 8993-9001. [Article]

NABOK, A. V., TSARGORODSKAYA, A., HOLLOWAY, A., STARODUB, N. F. and GOJSTER, O. (2007). Registration of T-2 mycotoxin with total internal reflection ellipsometry and QCM impedance methods. Biochemical and Biomolecular Sensing, 22 (6), 885-890. [Article]

NABOK, A. V., TSARGORODSKAYA, A., HOLLOWAY, A., STARODUB, N. F. and DEMCHENKO, A. (2007). Specific binding of large aggregates of amphiphilic molecules to the respective antibodies. Langmuir, 23 (16), 8485-8490. [Article]

NABOK, A. V., TSARGORODSKAYA, A., DAVIS, F. and HIGSON, S. P. J. (2007). The study of genomic DNA adsorption and subsequent interactions using total internal reflection ellipsometry. Biosensors and Bioelectronics, 23 (3), 377-383. [Article]

BASOVA, T., KOL'TSOV, E., HASSAN, A. K., TSARGORODSKAYA, A., RAY, A. and IGUMENOV, I. (2005). Thin films of copper hexadecafluorophthalocyanine CuPcF16. Physica status solidi b Basic Solid State Physics, 242 (4), 822-827. [Article]

NABOK, A. V., TSARGORODSKAYA, A., HASSAN, A. K. and STARODUB, N. F. (2005). Total internal reflection ellipsometry and SPR detection of low molecular weight environmental toxins. Applied Surface Science, 246 (4), 381-386. [Article]

TSARGORODSKAYA, A., NABOK, A. V. and RAY, A. K. (2004). Ellipsometric study of the adsorption of bovine serum albumin into porous silicon. Nanotechnology, 15 (5), 703-709. [Article]

TSARGORODSKAYA, A., NABOK, A. V. and RAY, A. K. (2003). Study of electroluminescence in porous silicon for sensing applications. IEE proceedings. Circuits, devices and systems, 150 (4), 355-360. [Article]

NABOK, A. V. and TSARGORODSKAYA, A. (2008). Ellipsometry study of ultra thin layers of evaporated gold. In: 4th International Conference on Spectroscopic Ellipsometry (ICSE-4), Stockholm, Sweden, Jun 11-15, 2007. 1150-1155. [Conference or Workshop Item]

NABOK, A. V., TSARGORODSKAYA, A., HOLLOWAY, A., STARODUB, N. F., DEMCHENKO, A. and GOJSTER, O. (2004). Registration of low molecular weight environmental toxins with total internal reflection ellipsometry. In: IEEE Sensors 2004 Conference, Vienna, Austria, Oct 24-27, 2004. [Conference or Workshop Item]