Items where Author is "Toal, S."

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CRAVEN, M. R., CRANTON, W. M., TOAL, S. and REEHAL, H. S. (1998). Characterization of BaTiO3 thin films deposited by RF magnetron sputtering for use in a.c. TFEL devices. Semiconductor Science and Technology, 13 (4), 404-409. [Article]

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