Items where Author is "Toal, S."
 | Up a level |
Jump to: None
Number of items: 1.
None
CRAVEN, M. R., CRANTON, W. M., TOAL, S. and REEHAL, H. S.
(1998).
Characterization of BaTiO3 thin films deposited by RF magnetron sputtering for use in a.c. TFEL devices.
Semiconductor Science and Technology, 13 (4), 404-409.