Items where SHU Author is "Murphy, J. D."

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Article

EVANS-FREEMAN, J. H., EMIROGLU, D., VERNON-PARRY, K., MURPHY, J. D. and WILSHAW, P. R. (2005). High resolution deep level transient spectroscopy applied to extended defects in silicon. Journal of physics. Condensed matter, 17 (22).

This list was generated on Mon Feb 6 16:47:30 2023 UTC.