Items where Author is "Mastio, E. A."

WILSON, S. L., CRANTON, Wayne, RANSON, R., KOUTSOGEORGIS, D. C., MOSLEY, A., THOMAS, C. B., BOUTAUD, G., WAGLAND, S., MASTIO, E. A., LIPIEC, S., SPILLER, A., SCOTT, J. and STOUTE, S. (2005). Optimization of the electrical and optical properties of ink-jet-printed SnO(2):Sb using thermal annealing and excimer-laser processing. Digest of Technical Papers - SID International Symposium, 36 (1), 530-533.

MASTIO, E. A., CRANTON, Wayne and THOMAS, C. B. (2001). Lattice misfit versus performance of thin film electroluminescent structures. Journal of Applied Physics, 89 (3), 1605-1611.

KOUTSOGEORGIS, D. C., MASTIO, E. A., CRANTON, Wayne and THOMAS, C. B. (2001). Pulsed KrF laser annealing of ZnS:Mn laterally emitting thin film electroluminescent displays. Thin Solid Films, 383 (1-2), 31-33.

MASTIO, E. A., FOGARASSY, E., CRANTON, Wayne and THOMAS, C. B. (2000). Ablation study on pulsed KrF laser annealed electroluminescent ZnS:Mn/Y2O3 multilayers deposited on Si. Applied Surface Science, 154, 35-39.

MASTIO, E. A., THOMAS, C. B., CRANTON, Wayne and FOGARASSY, E. (2000). Effects of multiple KrF laser irradiations on the electroluminescence and photoluminescence of rf-sputtered ZnS:Mn-based electroluminescent thin film devices. Applied Surface Science, 157 (1), 74-80.

CRANTON, W. M., MASTIO, E. A., THOMAS, C. B., TSAKONAS, C. and STEVENS, R. (2000). Laser processing for enhanced performance thin film electroluminescent devices. Electronic letters, 36 (8), 754-756.

MASTIO, E. A., CRANTON, Wayne and THOMAS, C. B. (2000). Pulsed laser annealing for high-efficiency thin film electroluminescent devices. Journal of Applied Physics, 88 (3), 1606-1611.

MASTIO, E. A., CRANTON, Wayne, THOMAS, C. B., FOGARASSY, E. and DE UNAMUNO, S. (1999). Pulsed KrF laser annealing of RF sputtered ZnS:Mn thin films. Applied Surface Science, 138-13 (1-4), 35-39.

MASTIO, E. A., CRAVEN, M. R., CRANTON, Wayne, THOMAS, C. B., ROBINO, M. and FOGARASSY, E. (1999). The effects of KrF pulsed laser and thermal annealing on the crystallinity and surface morphology of radiofrequency magnetron sputtered ZnS:Mn thin films deposited on Si. Journal of Applied Physics, 86 (5), 2562-2570.