Items where Author is "Kappers, M.J."

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ELSHERIF, O.S., VERNON-PARRY, Karen, DHARMADASA, I, EVANS-FREEMAN, J.H., AIREY, R.J., KAPPERS, M.J. and HUMPHREYS, C.J. (2012). Characterization of defects in Mg doped GaN epitaxial layers using conductance measurements. Thin Solid Films, 520 (7), 3064-3070. [Article]

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