Items where Author is "James, Neil"

ASQUITH, David, HUGHES, Darren, HATTINGH, Danie, JAMES, Neil, JOHN, Yates and ALEKSEY, Yerokhin (2013). Depth Resolved Measurement of the 3D Residual Stress State in Surface Engineered Aluminium by Synchrotron Diffraction. In: SHIH, Kaimin, (ed.) X-Ray Diffraction : Structure, Principles and Applications. Materials Science and Technologies . Nova Science. [Book Section]

ASQUITH, David, YEROKHIN, Aleksey, JAMES, Neil, YATES, John and MATTHEWS, Allan (2013). Evaluation of Residual Stress Development at the Interface of Plasma Electrolytically Oxidized and Cold-Worked Aluminum. Metallurgical and Materials Transactions. A.,Physical Metallurgy and Materials Science, 44 (10), 4461-4465. [Article]