Coulomb effects in lattice-matched, strained and strain-relieved low dimensional semiconductors and their relevance for device simulation

Tools

PEREIRA, Mauro (1995). Coulomb effects in lattice-matched, strained and strain-relieved low dimensional semiconductors and their relevance for device simulation. In: OSINSKI, Marek. and CHOW, Weng W., (eds.) SPIE Proceeding. Bellingham, Washington, SPIE 1995, 660-671. [Book Section]

More Information
Additional Information:
Physics and Simulation of Optoelectronic Devices III
Research Institute, Centre or Group - Does NOT include content added after October 2018:
Materials and Engineering Research Institute > Advanced Coatings and Composites Research Centre > Electronic Materials and Sensors Research Group
Page Range:
660-671
ISBN:
0819417467

Identifiers

ORCID:
https://orcid.org/0000-0002-2276-2095

Library

Item Type:
Book Section
Depositing User:
Helen Garner
Date Deposited:
12 Dec 2014 14:52
Last Modified:
18 Mar 2021 19:00
URI:
https://shura.shu.ac.uk/id/eprint/9025
Metrics

Altmetric Badge

Dimensions Badge

Share
Add to AnyAdd to TwitterAdd to FacebookAdd to LinkedinAdd to PinterestAdd to Email

Actions (login required)

View Item View Item

SHURA supports OAI 2.0 with a base URL of https://shura.shu.ac.uk/cgi/oai2