In-situ focussed ion beam (FIB) microscopy at high temperature

FIELDEN, I., BULTREYS, D. and VYSTAVEL, T. (2007). In-situ focussed ion beam (FIB) microscopy at high temperature. In: Institute of Physics conference series. Electron Microscopy and Analysis Group (EMAG) 2007, Glasgow, Scotland, 03-07 September 2007. [Conference or Workshop Item]

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