A tutorial on double pulse test of silicon and silicon carbide MOSFETs

MASOUD, Mahmoud, ISSA, Walid and YATES, Wilfred (2023). A tutorial on double pulse test of silicon and silicon carbide MOSFETs. In: Proceedings. 2023 IEEE Workshop on Electrical Machines Design, Control and Diagnosis (WEMDCD). IEEE.

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Official URL: https://ieeexplore.ieee.org/document/10110895
Link to published version:: https://doi.org/10.1109/WEMDCD55819.2023.10110895


In the power electronics and machine drives area, recent advancements in power electronics devices are paving a more sustainable future. The importance of improved power devices is beneficial within the growing industry, for example, Electric Vehicles. New power devices are continuously researched to combat drawbacks like loss and switching time. The electrical engineering curriculum should be supported by market-oriented knowledge and industry skills based on the market leaders' vision and recruiting plans. Our ultimate objective is to modify the power electronics modules' curriculum and reskill our graduates to satisfy the industry's needs. This paper introduces one of the topics in power electronics which was identified as an industry requirement: the Double Pulse Test (DPT), to be highlighted in future curriculums. This test will be used as a comparison tool for two power electronic devices: Silicon MOSFET (Si-MOSFET) and Silicon Carbide MOSFET (SiC-MOSFET).

Item Type: Book Section
Additional Information: Newcastle University, Newcastle upon Tyne, 13-14 April 2023 ISSN: 2380-856X © 2023 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Identification Number: https://doi.org/10.1109/WEMDCD55819.2023.10110895
SWORD Depositor: Symplectic Elements
Depositing User: Symplectic Elements
Date Deposited: 14 Apr 2023 14:08
Last Modified: 11 Oct 2023 15:01
URI: https://shura.shu.ac.uk/id/eprint/31766

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