STACEY, Peter, HALL, Samantha, STAGG, Stephen, CLEGG, Francis and SAMMON, Chris (2021). Raman spectroscopy and X‐ray diffraction responses when measuring health‐related micrometre and nanometre particle size fractions of crystalline quartz and the measurement of quartz in dust samples from the cutting and polishing of natural and artificial stones. Journal of Raman Spectroscopy. [Article]
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What is it about?
The study compares the performance of Raman spectroscopy and X-ray diffraction (XRD) for measuring respirable crystalline silica (RCS) in samples of pure quartz powder and stone dusts from various natural and artificial stones. Raman spectroscopy showed a lower limit of detection (LOD) of 0.21 μg compared to XRD's 1 μg. The two techniques were highly correlated for the health-related thoracic and respirable particle size fractions, with coefficients of determination between 0.98 and 0.95. Raman spectroscopy is a promising alternative to XRD for measuring RCS, particularly in samples containing significant levels of zircon.Why is it important?
This research is important because it presents a new method for measuring respirable crystalline silica (RCS), a harmful substance that can cause diseases like silicosis and lung cancer. The study compares the performance of Raman spectroscopy with the reference technique of X-ray diffraction (XRD) and shows that Raman spectroscopy is a promising alternative to XRD for measuring RCS with a much lower limit of detection. This is significant because there are around 560,000 workers in Great Britain who are potentially exposed to RCS, and accurate measurement is essential for assessing and controlling exposure levels in the workplace.Key Takeaways:
1. Raman spectroscopy is a promising alternative to XRD for measuring RCS with a lower limit of detection.
2. Raman spectroscopy is highly correlated with XRD when measuring health-related particle size fractions of aerosols generated from the cutting and polishing of natural and artificial stones.
3. Raman spectroscopy has a distinct advantage over XRD when measuring crystalline silica in samples containing significant levels of zircon.
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