Van der Pauw resistivity measurements on thermally evaporated copper phthalocyanine thin films

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HASSAN, A. K., GOULD, R. D. and RAY, A. K. (1996). Van der Pauw resistivity measurements on thermally evaporated copper phthalocyanine thin films. physica status solidi a, 158 (2), K23-K25. [Article]

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Official URL:
https://onlinelibrary.wiley.com/doi/abs/10.1002/ps...
Research Institute, Centre or Group - Does NOT include content added after October 2018:
Materials and Engineering Research Institute > Advanced Coatings and Composites Research Centre > Electronic Materials and Sensors Research Group
Page Range:
K23-K25

Identifiers

Identification Number:
10.1002/pssa.2211580234
ORCID for A. K. Hassan: ORCID iD orcid.org/0000-0002-7891-8087

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Item Type:
Article
Depositing User:
Helen Garner
Date Deposited:
03 Jun 2010 10:58
Last Modified:
18 Mar 2021 13:16
URI:
https://shura.shu.ac.uk/id/eprint/1988
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