Items where Author is "Palin‐Luc, Thierry"

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HONG, Youshi, VORMWALD, Michael, SUSMEL, Luca, MENEGHETTI, Giovanni and PALIN‐LUC, Thierry (2026). Guest Editorial: Characterization of Crack/Notch Tip Fields (CCTF7). Fatigue & Fracture of Engineering Materials & Structures. [Article]

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