Items where Author is "Murphy, J. D."

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EVANS-FREEMAN, J. H., EMIROGLU, D., VERNON-PARRY, K., MURPHY, J. D. and WILSHAW, P. R. (2005). High resolution deep level transient spectroscopy applied to extended defects in silicon. Journal of physics. Condensed matter, 17 (22).

This list was generated on Sun May 5 23:44:46 2024 UTC.