Items where Author is "James, Neil"
Number of items: 2.
ASQUITH, David, HUGHES, Darren, HATTINGH, Danie, JAMES, Neil, JOHN, Yates and ALEKSEY, Yerokhin
(2013).
Depth Resolved Measurement of the 3D Residual Stress State in Surface Engineered Aluminium by Synchrotron Diffraction.
In: SHIH, Kaimin, (ed.)
X-Ray Diffraction : Structure, Principles and Applications.
Materials Science and Technologies
.
Nova Science.
ASQUITH, David, YEROKHIN, Aleksey, JAMES, Neil, YATES, John and MATTHEWS, Allan
(2013).
Evaluation of Residual Stress Development at the Interface of Plasma Electrolytically Oxidized and Cold-Worked Aluminum.
Metallurgical and Materials Transactions. A.,Physical Metallurgy and Materials Science, 44 (10), 4461-4465.