Items where Author is "Hughes, Darren"
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ASQUITH, David, HUGHES, Darren, HATTINGH, Danie, JAMES, Neil, JOHN, Yates and ALEKSEY, Yerokhin
(2013).
Depth Resolved Measurement of the 3D Residual Stress State in Surface Engineered Aluminium by Synchrotron Diffraction.
In: SHIH, Kaimin, (ed.)
X-Ray Diffraction : Structure, Principles and Applications.
Materials Science and Technologies
.
Nova Science.