Items where Author is "Evangelou, E. K."
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EVANGELOU, E. K., WIEMER, C., FANCIULLI, M., SETHU, M. and CRANTON, Wayne
(2003).
Electrical and structural characteristics of yttrium oxide films deposited by rf-magnetron sputtering on n-Si.
Journal of Applied Physics, 94 (1), 318-325.
EVANGELOU, E. K., KONOFAOS, N., CRAVEN, M. R., CRANTON, W. M. and THOMAS, C. B.
(2000).
Characterization of the BaTiO3/p-Si interface and applications.
Applied Surface Science, 166 (1), 504-507.