In-situ focussed ion beam (FIB) microscopy at high temperature

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FIELDEN, I., BULTREYS, D. and VYSTAVEL, T. (2007). In-situ focussed ion beam (FIB) microscopy at high temperature. In: Institute of Physics conference series. Electron Microscopy and Analysis Group (EMAG) 2007, Glasgow, Scotland, 03-07 September 2007.

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    Item Type: Conference or Workshop Item (Paper)
    Research Institute, Centre or Group - Does NOT include content added after October 2018: Materials and Engineering Research Institute > Advanced Coatings and Composites Research Centre > Nanotechnology Centre for PVD Research
    Depositing User: Ann Betterton
    Date Deposited: 28 Jul 2008
    Last Modified: 19 Mar 2021 01:15
    URI: https://shura.shu.ac.uk/id/eprint/587

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