In-situ focussed ion beam (FIB) microscopy at high temperature

FIELDEN, I., BULTREYS, D. and VYSTAVEL, T. (2007). In-situ focussed ion beam (FIB) microscopy at high temperature. In: Institute of Physics conference series. Electron Microscopy and Analysis Group (EMAG) 2007, Glasgow, Scotland, 03-07 September 2007.

Full text not available from this repository.
Item Type: Conference or Workshop Item (Paper)
Research Institute, Centre or Group: Materials and Engineering Research Institute > Thin Films Research Centre > Nanotechnology Centre for PVD Research
Depositing User: Ann Betterton
Date Deposited: 28 Jul 2008
Last Modified: 09 Dec 2009 18:23
URI: http://shura.shu.ac.uk/id/eprint/587

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