Multiphase identification in Ni–PbTe contacts by EBSD and aberration-corrected STEM

FERRERES, Xavier Reales, CASILLAS, Gilberto, AMINORROAYA-YAMINI, Sima and GAZDER, Azdiar A. (2019). Multiphase identification in Ni–PbTe contacts by EBSD and aberration-corrected STEM. Materials & Design, 185, p. 108252.

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Link to published version:: https://doi.org/10.1016/j.matdes.2019.108252
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    Abstract

    EBSD in combination with aberration-corrected STEM is used to study the interfacial layer forming at Ni electrode - PbTe thermoelectric material interfaces. Contrary to previous studies, both orthorhombic and monoclinic phases are identified within the interfacial layer. EBSD and STEM data at interphase boundaries demonstrate an approximately smooth transition from orthorhombic to monoclinic phase with almost no crystal defects due to the small differences in lattice parameters and the prevalence of one of two previously unknown orientation relationships between the phases. Moreover, the presence of special boundaries resulting in orientation domains within both phases throughout the interfacial nickel telluride layer needs to be considered when fabricating future thermoelectric devices.

    Item Type: Article
    Additional Information: ** Article version: AM ** From Elsevier via Jisc Publications Router ** Licence for AM version of this article starting on 03-10-2019: http://creativecommons.org/licenses/by-nc-nd/4.0/ **Journal IDs: issn 02641275 **History: issue date 10-10-2019; accepted 03-10-2019
    Identification Number: https://doi.org/10.1016/j.matdes.2019.108252
    Page Range: p. 108252
    SWORD Depositor: Helen Garner
    Depositing User: Helen Garner
    Date Deposited: 28 Oct 2019 15:31
    Last Modified: 28 Oct 2019 15:31
    URI: http://shura.shu.ac.uk/id/eprint/25282

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