Van der Pauw resistivity measurements on thermally evaporated copper phthalocyanine thin films

HASSAN, A. K., GOULD, R. D. and RAY, A. K. (1996). Van der Pauw resistivity measurements on thermally evaporated copper phthalocyanine thin films. physica status solidi a, 158 (2), K23-K25.

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Official URL: https://onlinelibrary.wiley.com/doi/abs/10.1002/ps...
Link to published version:: https://doi.org/10.1002/pssa.2211580234
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    Item Type: Article
    Research Institute, Centre or Group - Does NOT include content added after October 2018: Materials and Engineering Research Institute > Thin Films Research Centre > Electronic Materials and Sensors Research Group
    Identification Number: https://doi.org/10.1002/pssa.2211580234
    Page Range: K23-K25
    Depositing User: Helen Garner
    Date Deposited: 03 Jun 2010 10:58
    Last Modified: 17 May 2018 16:27
    URI: http://shura.shu.ac.uk/id/eprint/1988

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