Van der Pauw resistivity measurements on thermally evaporated copper phthalocyanine thin films

HASSAN, A. K., GOULD, R. D. and RAY, A. K. (1996). Van der Pauw resistivity measurements on thermally evaporated copper phthalocyanine thin films. physica status solidi b, 158 (2), K23-K25.

Full text not available from this repository.
Link to published version:: 10.1016/j.tca.2010.01.019
Item Type: Article
Research Institute, Centre or Group: Materials and Engineering Research Institute > Thin Films Research Centre > Electronic Materials and Sensors Research Group
Identification Number: 10.1016/j.tca.2010.01.019
Depositing User: Helen Garner
Date Deposited: 03 Jun 2010 11:58
Last Modified: 03 Jun 2010 11:58
URI: http://shura.shu.ac.uk/id/eprint/1988

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