Van der Pauw resistivity measurements on thermally evaporated copper phthalocyanine thin films

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HASSAN, A. K., GOULD, R. D. and RAY, A. K. (1996). Van der Pauw resistivity measurements on thermally evaporated copper phthalocyanine thin films. physica status solidi b, 158 (2), K23-K25.

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Link to published version:: 10.1016/j.tca.2010.01.019
Item Type: Article
Research Institute, Centre or Group: Materials and Engineering Research Institute > Thin Films Research Centre > Electronic Materials and Sensors Research Group
Identification Number: 10.1016/j.tca.2010.01.019
Depositing User: Helen Garner
Date Deposited: 03 Jun 2010 11:58
Last Modified: 03 Jun 2010 11:58
URI: http://shura.shu.ac.uk/id/eprint/1988

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