Spectral characterization of thin films of vanadyl hexadecafluorophthalocyanine VOPcF16

BASOVA, T., PLYASHKEVICH, V. and HASSAN, A. K. (2008). Spectral characterization of thin films of vanadyl hexadecafluorophthalocyanine VOPcF16. Surface Science, 602 (14), 2368-2372.

Full text not available from this repository.
Link to published version:: https://doi.org/10.1016/j.susc.2008.04.044
Related URLs:

    Abstract

    In this work, structural features and optical properties of hexadecafluorosubstituted vanadyl phthalocyanine (VOPcF16) films deposited by Organic Molecular Beam Deposition (OMBD) technique have been investigated. Thin films of VOPcF16 were characterised by ellipsometry, optical absorption and vibrational (IR and Raman) spectroscopy. VOPcF16 films deposited onto silicon and quartz substrates held at room temperature are well organized and characterised by a predominantly co-facial parallel arrangement of molecules vertical to the surface. Thermal treatment of these films at 220 degrees C leads to the transition from one phase to another and formation of the polycrystalline VOPcF16 films with randomly distributed crystallites on the substrate surface. (C) 2008 Elsevier B.V. All rights reserved.

    Item Type: Article
    Research Institute, Centre or Group - Does NOT include content added after October 2018: Materials and Engineering Research Institute > Thin Films Research Centre > Electronic Materials and Sensors Research Group
    Identification Number: https://doi.org/10.1016/j.susc.2008.04.044
    Page Range: 2368-2372
    Depositing User: Helen Garner
    Date Deposited: 21 May 2010 10:45
    Last Modified: 13 Jun 2017 12:46
    URI: http://shura.shu.ac.uk/id/eprint/1968

    Actions (login required)

    View Item View Item

    Downloads

    Downloads per month over past year

    View more statistics