Automated numerical characterization of dilute semiconductors per comparison with luminescence

YANG, X., ORIAKU, C.I., ZUBELLI, J.P. and PEREIRA, Mauro (2017). Automated numerical characterization of dilute semiconductors per comparison with luminescence. Optical and Quantum Electronics, 49 (3).

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Link to published version:: https://doi.org/10.1007/s10825-011-0375-6
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Abstract

This paper combines analytical approximations for the optical absorption and luminescence of semiconductors with Trust Region-Reflective (TRR) methods methods, delivering a robust numerical characterization method to be used in the study of new bulk semiconductors per direct comparison with experimental spectra. It further extends recent applications of the theory to the case of dilute nitride semiconductors and confirms results for the s-shape of the luminescence peak as a function of temperature.

Item Type: Article
Uncontrolled Keywords: semiconductors; dilute nuitrides; luminescence; mid infrared; many body effects
Research Institute, Centre or Group - Does NOT include content added after October 2018: Materials and Engineering Research Institute > Thin Films Research Centre > Electronic Materials and Sensors Research Group
Identification Number: https://doi.org/10.1007/s10825-011-0375-6
Depositing User: Jill Hazard
Date Deposited: 20 Jan 2017 11:50
Last Modified: 08 Jul 2019 17:32
URI: http://shura.shu.ac.uk/id/eprint/14809

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