Electrostatically self-assembled films containing II-VI semiconductor nanoparticles: Optical and electrical properties

NABOK, A. V., TSARGORODSKAYA, A., HASSAN, A. K. and DAVIS, F. (2008). Electrostatically self-assembled films containing II-VI semiconductor nanoparticles: Optical and electrical properties. Thin Solid Films, 516 (24), 8917-8925.

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Link to published version:: 10.1016/j.tsf.2007.11.067

Abstract

US and ZnS semiconducting colloid nanoparticles were deposited as thin films using the technique of electrostatic self-assembly. The process of alternative deposition of Poly-allylamine Hydrochloride (PAH) and CdS (or ZnS) layers were monitored with a novel optical method of total internal reflection ellipsometry (TIRE). The fitting of TIRE spectra allowed the evaluation of the parameter (thickness, refractive index and extinction coefficients) of all consecutively deposited layers. 1-V characteristics of the films obtained were studied in sandwich structures on Indium Tin Oxide (ITO) conductive electrodes using the mercury probe technique. The presence of US (or ZnS) nanoparticles in the polyelectrolyte films leads to a switching behaviour, which may be attributed to the resonance electron tunneling via semiconducting nanoparticles. (c) 2008 Elsevier B.V. All rights reserved.

Item Type: Article
Additional Information: 10th European Conference on Organised Films (ECOF-10) AUG 21-24, 2006, Riga, LATVIA
Research Institute, Centre or Group: Materials and Engineering Research Institute > Thin Films Research Centre > Electronic Materials and Sensors Research Group
Identification Number: 10.1016/j.tsf.2007.11.067
Depositing User: Ann Betterton
Date Deposited: 30 Mar 2010 17:10
Last Modified: 30 Mar 2010 17:10
URI: http://shura.shu.ac.uk/id/eprint/1452

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