Ellipsometry study of ultra thin layers of evaporated gold

NABOK, A. V. and TSARGORODSKAYA, A. (2008). Ellipsometry study of ultra thin layers of evaporated gold. In: 4th International Conference on Spectroscopic Ellipsometry (ICSE-4), Stockholm, Sweden, Jun 11-15, 2007. 1150-1155.

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Abstract

Optical properties of ultra thin (from 1 to 40 nm) films of gold evaporated on glass; and silicon were studied with the method of spectroscopic ellipsometry in both external and internal reflection configurations as well as with the UV-visible absorption spectroscopy. The results obtained showed a gradual shift of the plasmon peak from 580 nm for 1 nm thick films to more than 1000 nm for thick (40 nm) gold films. Such phenomenon can be interpreted in terms of quantum confinement of surface plasmons in gold islands. The threshold of the metal-dielectric transition was found at the film thickness between 4 and 5 nm. Thiolation of the surface of glass has resulted in a slight decrease in the effective thickness of gold layer and respective smaller blue shift of n(lambda) and k(lambda) dispersion curves, however no dramatic changes were observed in the film morphology.

Item Type: Conference or Workshop Item (Paper)
Additional Information:
Research Institute, Centre or Group: Materials and Engineering Research Institute > Thin Films Research Centre > Electronic Materials and Sensors Research Group
Depositing User: Ann Betterton
Date Deposited: 20 Apr 2010 16:52
Last Modified: 20 Apr 2010 16:52
URI: http://shura.shu.ac.uk/id/eprint/1444

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