The method of total internal reflection ellipsometry for thin film characterisation and sensing

NABOK, A. V. and TSARGORODSKAYA, A. (2008). The method of total internal reflection ellipsometry for thin film characterisation and sensing. Thin Solid Films, 516 (24), 8993-9001.

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Link to published version:: 10.1016/j.tsf.2007.11.077

Abstract

Recently developed method of Total Internal Reflection Ellipsometry (TIRE) represents a very successful combination of the spectroscopic ellipsometry instrumentation with the Kretchmann type Surface Plasmon Resonance (SPR) geometry of the experiment. The modelling shows much higher sensitivity of the TIRE method to small changes in optical parameters (thickness and refractive index) of thin films, as compared to both traditional external reflection ellipsometry and SPR. Considering another advantage of performing the measurements in media of different optical density (and even opaque media), TIRE becomes very convenient for different sensing applications in both gaseous and liquid media, as well as for thin film characterisation. This work presents examples of applications of the TIRE method for the study of DNA hybridization and the registration of low molecular weight toxins. (C) 2007 Elsevier B.V. All rights reserved.

Item Type: Article
Additional Information: 10th European Conference on Organised Films (ECOF-10) AUG 21-24, 2006, Riga, LATVIA
Research Institute, Centre or Group: Materials and Engineering Research Institute > Thin Films Research Centre > Electronic Materials and Sensors Research Group
Identification Number: 10.1016/j.tsf.2007.11.077
Depositing User: Ann Betterton
Date Deposited: 31 Mar 2010 17:16
Last Modified: 31 Mar 2010 17:16
URI: http://shura.shu.ac.uk/id/eprint/1440

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