Impedance analysis of the thickness shear mode resonator for organic vapour sensing

HOLLOWAY, A. R., NABOK, A. V., THOMPSON, M., RAY, A. K. and WILKOP, T. (2004). Impedance analysis of the thickness shear mode resonator for organic vapour sensing. Sensors and Actuators B Chemical, 99 (2-3), 355-360.

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Link to published version:: 10.1016/j.snb.2003.12.002


The impedance analysis of thickness shear mode (TSM) resonator coated with calixarene films was successfully exploited for the registration of organic solvent vapours of relatively high (pre-explosive) concentrations. The impedance analysis consisted of fitting the experimental admittance spectra of TSM resonators to the equivalent circuit model using a highly accurate and reliable least squares algorithm. This approach allowed simultaneous monitoring of the changes in mass and viscoelastic properties of the sensitive membrane caused by adsorption of organic vapours and therefore enables both quantification and discrimination between the vapours of different types of organic solvents, such as hexane and toluene. (C) 2003 Elsevier B.V. All rights reserved.

Item Type: Article
Research Institute, Centre or Group: Materials and Engineering Research Institute > Thin Films Research Centre > Electronic Materials and Sensors Research Group
Identification Number: 10.1016/j.snb.2003.12.002
Depositing User: Ann Betterton
Date Deposited: 20 Apr 2010 10:27
Last Modified: 13 Jun 2017 12:46

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