Effects of multi-defects at metal/semiconductor interfaces on electrical properties and their influence on stability and lifetime of thin film solar cells

DHARMADASA, I, BUNNING, J. D., SAMANTILLEKE, A. P. and SHEN, T. (2005). Effects of multi-defects at metal/semiconductor interfaces on electrical properties and their influence on stability and lifetime of thin film solar cells. Solar Energy Materials & Solar Cells, 86 (3), 373-384.

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Link to published version:: https://doi.org/10.1016/j.solmat.2004.08.009
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    Abstract

    This communication analyses some of the results observed for metal/n-CdTe interfaces in the mid-1980s, which could not be interpreted at that time. These observations are analysed on the basis of new understanding using a new model proposed for CdS/CdTe thin film solar cells. The observed behaviour of current voltage characteristics of electrical contacts to n-CdTe under electrical and illumination stresses are explained and the effects of these changes on CdS/CdTe solar cells are discussed. Future research directions for the development of CdS/ CdTe solar cells are proposed and the way forward for improvement of stability and lifetime of solar cells is suggested. A summary of recent electrical contact work on metal/ Cu(InGa)(SSe)(2) interfaces is also presented and similar behaviour is reported. (C) 2004 Elsevier B.V. All rights reserved.

    Item Type: Article
    Research Institute, Centre or Group - Does NOT include content added after October 2018: Materials and Engineering Research Institute > Thin Films Research Centre > Electronic Materials and Sensors Research Group
    Identification Number: https://doi.org/10.1016/j.solmat.2004.08.009
    Page Range: 373-384
    Depositing User: Ann Betterton
    Date Deposited: 08 Mar 2010 15:31
    Last Modified: 11 Jan 2017 10:17
    URI: http://shura.shu.ac.uk/id/eprint/1262

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