Items where SHU Author is "Fielden, Iain"
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FIELDEN, I., BULTREYS, D. and VYSTAVEL, T. (2007). In-situ focussed ion beam (FIB) microscopy at high temperature. In: Institute of Physics conference series. Electron Microscopy and Analysis Group (EMAG) 2007, Glasgow, Scotland, 03-07 September 2007.
FIELDEN, I. (2004). From in-situ, real-time SEM observations on grain growth in polycrystalline metal. Materials science forum, 467-47, 875-880.
FIELDEN, I. and RODENBURG, J. M. (2004). A technique for real-time, in situ SEM observation of grain growth at elevated temperatures. Materials science forum, 467-47, 1385-1388.
FIELDEN, Iain, CAWLEY, J. and RODENBURG, J. M. (2004). Backscattered SEM imaging of high-temperature samples for grain growth studies in metals. Electron microscopy and analysis (179), 181-184.
FIELDEN, Iain (2004). Results from in-situ, real-time SEM observations of grain growth in polycrystalline metal. Recrystallization and Grain Growth, Pts 1 and 2, 467-47, 875-880.